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“Tomorrow’s Instruments Today” — “For Good Measure” ® |
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A Leading South African Test and Measurement Instruments Supplier |
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“For Good Measure”® |
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TMI, Established—1982 |
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Test and Measurement Instruments C.C. |
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Test our Service and Measure with our Instruments. |
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CK 85/07464/23 |
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Please contact us by phone, fax, email or visit us at the details given above. We look forward to hearing from you. |
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Product List |
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All brands, trade names, trade marks, and logos are the property of their respective owners. |
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Brand Names |
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T + M ® |
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English, Afrikaans and Portuguese Speaking No Credit Card Payments yet. |
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Ph: +27 (011) 683 4365 Fax: +27 (011) 683 4461 E-mail: t.m.i@iafrica.com
Physical Address: 1st Floor, TMI House, 37 Garden St, Cnr 160 Bellavista Rd, Turfclub, Johannesburg, 2135 SOUTH AFRICA
Postal Address: P.O. Box 1416, Southdale, Johannesburg, 2135, SOUTH AFRICA
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T.M.I. |
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This Month’s Special |
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Excess Stock to be cleared while stocks last. > Click for More... |
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Thermography—Thermal Imager— Infrared Camera. FLIR i3 — Smallest , Lightest, most affordable camera “point-shoot-detect”. Introductory Nett Price of R 11 990.00 + VAT while stocks last. |
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Oscilloscope Probes |
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Oscilloscope Probes |
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Part No: TX3125 |
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DC to 250Mhz Oscilloscope Probe, 100 : 1. Maximum Voltage is 1200 V DC and AC Peak |
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T + M® |
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Part No: LF190E |
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60Mhz Oscilloscope Probe, X1: X10 |
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Part No: LF210E |
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100Mhz Oscilloscope Probe, X1: X10 |
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T + M® |
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T + M® |
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Part No: LF250E |
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250Mhz Oscilloscope Probe, X1: X10 |
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T + M® |
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Part No: TM-25 |
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Differential Probe, DC to 25Mhz, making floating Measurements, compatible with Digital and Analog Oscilloscopes. Attenuation 1/20 & 1/200, 1400V input |
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T + M® |
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Notes on Electrical Test Probes. Electrical test probes are used to establish a connection between a circuit under test and the measuring instrument. There are several basic types of products. Voltage probes are used to measure voltage. Current probes are used to measure current. Oscilloscope probes have a specified operating bandwidth and, in some cases, built-in switchable attenuators. Differential probes are used to measure differential signals which are referenced to each other instead of ground. By contrast, single-ended test probes are electrical test probes used to measure signals referenced to ground. Logic probes are used to measure logic levels in digital circuits. Semiconductor probes and high-density probes are fine point, spring loaded probes that are usually mounted in a test jig. These electrical test probes are used to test semiconductor interconnects and high-density circuit boards. Other types of electrical test probes include coaxial probes, polarity probes, continuity probes, high frequency probes, high voltage probes, magnetic probes, and optical probes. A coaxial test probe is a spring loaded, signal-conducting probe insulated from its shell or shielding tube by a dielectric material. Coaxial test probes have rated nominal impedance similar to a coaxial cable. A polarity probe automatically determines the polarity of the circuit under test. A continuity probe is used to test circuit conditions for continuous connection. Typically, continuity test probes are bundled with a continuity tester. A high voltage probe is used to measure high voltage signals. Magnetic probes sense magnetic fields in solenoid-operated devices, stepper switches, relays, valves and coils. Optical probes are electrical test probes that convert optical signals into electrical signals for convenient analysis of oscilloscopes and other devices. Selecting electrical test probes requires an analysis of performance specifications. The attenuation factor is the amount by which the electrical test probe reduces the amplitude of the signal being measured. This extends the measurement range for an instrument such as an oscilloscope. For instance, a 10X probe reduces the measured signal to 0.1 of its amplitude, allowing the test instrument to measure signals ten times larger than what its maximum range allows. Choices typically include 1X, 10X, 100X, 500X, and 1000X. There are many different configurations for electrical test probes. An alligator clip electrical test probe has a spring-loaded jaw with serrated teeth that grip the point being measured. A bent metal electrical test probe has bent metal contacts, relatively fine pieces of metal that are formed into a curvilinear shape in order to provide a cantilever effect. Normally, the metal contacts are then insert-molded or stuffed into a nonconductive carrier. A portion of the metal contact protrudes beneath the carrier for attachment to a printed circuit board (PCB) by surface mount or through-hole interconnection. A board or chip configuration has a specialized probe tip that is used to examine signals on PCBs and integrated circuit (IC) chips. Other configurations include conductive elastomers, extended-fine tip, flat blade, hook, pin-and-socket, pincher, probe card, spade lug, spring loaded, and wireless. |
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Copyright © 2009—2012 Test and Measurement Instruments C.C. | All rights reserved Oscilloscope Probes |